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Substrate Noise Coupling in RFICs

The book reports modeling and simulation techniques for substrate noise coupling effects in RFICs and introduces isolation structures and design guides to mitigate such effects with the ultimate goal of enhancing the yield of RF and mixed signal SoCs. The book further reports silicon measurements, and new test and noise isolation structures. To the authors’ knowledge, this is the first title devoted to the topic of substrate noise coupling in RFICs as part of a large SoC.

Figure 5.9 shows the simulation vs. measurement data after de-embedding.
Appendix B explains the measurement details. The inductor parameters are
shown on the plots and they vary from 180 m outer diameter to 120 m, and coil
width of 11 ...