Advanced Trace Analysis
Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of uranium relevant to waste disposal and management along with the use of greener techniques for trace elemental speciation analysis
- ISBN 13 : 9781842655917
- ISBN 10 : 1842655914
- Judul : Advanced Trace Analysis
- Pengarang : Susanta Lahiri,
- Kategori : Mathematics
- Penerbit : Alpha Science International Limited
- Bahasa : en
- Tahun : 2010
- Halaman : 179
- Halaman : 179
- Google Book : http://books.google.co.id/books?id=WlQ1QQAACAAJ&dq=inauthor:susanta&hl=&source=gbs_api
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Ketersediaan :
Advanced Trace Analysis in six chapters, by eminent scientists, discusses statistical approaches to verify trace element analysis data, trace analysis techniques like ICPMS and XRF, ion beam analysis techniques, speciation analysis of ...