New approaches and methods for MOS device characterization and design with gate lengths to 100 nm
- ISBN 10 : CORNELL:31924050420193
- Judul : New approaches and methods for MOS device characterization and design with gate lengths to 100 nm
- Pengarang : John Scarpulla,
- Kategori : Technology & Engineering
- Bahasa : en
- Tahun : 1988
- Halaman : 700
- Halaman : 700
- Google Book : http://books.google.co.id/books?id=41RUAAAAYAAJ&dq=intitle:approaches+and+methods&hl=&source=gbs_api
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